Welcome to the website of the Advanced Materials Diffraction Lab within the Semiconductor Spectroscopy & Devices Group in the Department of Physics at the University of Strathclyde.
We specialise in the application of electron backscatter diffraction (EBSD) and electron channelling contract imaging (ECCI) in the scanning electron microscope (SEM). We use these techniques for the study of crystal structure, (mis)orientation, elastic strain, grain and grain boundaries, crystal polarity and extended defects in semiconducting materials, in particular III-nitride semiconductors.