- Data for: "Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction"
- Data for "Role of the electron transport layer in dictating the nanoscale heterogeneity in all-inorganic perovskite absorbers – correlating the optoelectronic and crystallographic properties "
- Data for: ''Strain-induced modifications of thin film silicon membranes by physical bending''
- Data for "Strain and luminescence properties of hexagonal hillocks in N-polar GaN"
- Data for "Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction"
- Data for "Unravelling the Chloride Dopant Induced Film Improvement in Inorganic Perovskite Absorber"
- Data for: "Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction"
- Electroluminescence hyperspectral images of light-emitting diodes
- Data for: "Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics"
- Data for: "Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy"
- Data for: "Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon"
- Data for: "A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content"
- Data for: "Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN"
- Data for: "Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope"
- Data for: "Improving EBSD precision by orientation refinement with full pattern matching"