Datasets – Advanced Materials Diffraction Lab


    
    
    

                        
            
            

    Data for: "Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction"







    
    
    





            
        
                    
            
            

    Electroluminescence hyperspectral images of light-emitting diodes







    
    
    





            
        
                    
            
            

    Data for: "Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics"







    
    
    





            
        
                    
            
            

    Data for: "Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light–electron microscopy"







    
    
    





            
        
                    
            
            

    Data for: "Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11–22) green LEDs grown on silicon"







    
    
    





            
        
                    
            
            

    Data for: "A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content"







    
    
    





            
        
                    
            
            

    Data for: "Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN"







    
    
    





            
        
                    
            
            

    Data for: "Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope"







    
    
    





            
        
                    
            
            

    Data for: "Improving EBSD precision by orientation refinement with full pattern matching"







    
    
    





            
        
                    
            
            

    Data for: "Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging"







    
    
    





            
        
                    
            
            

    Data for: "Luminescence behaviour of semi-polar (10-11) InGaN/GaN 'bow-tie' structures on patterned Si substrates"







    
    
    





            
        
                    
            
            

    Data for: "AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy"







    
    
    





            
        
                    
            
            

    Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”







    
    
    





            
        
                    
            
            

    Data for: "Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope"







    
    
    





            
        
                    
            
            

    Dataset for: "Monolithic multiple colour emission from InGaN grown on patterned non-polar GaN"







    
    
    





            
        
                    
            
            

    Data for: Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging







    
    
    





            
        
                    
            
            

    Data for: "Cathodoluminescence studies of chevron features in semi-polar (11-22) InGaN/GaN multiple quantum well structures"







    
    
    





            
        
                    
            
            

    Data for: "Design and fabrication of enhanced lateral growth for dislocation reduction and strain management in GaN using nanodashes"







    
    
    





            
        
                    
            
            

    Data for: "Spatially-resolved optical and structural properties of semi-polar (11-22) Al_xGa_(1-x)N with x up to 0.56"







    
    
    





            
        
                    
            
            

    Data for Diffractive triangulation of radiative point sources







    
    
    





            
        
                    
            
            

    Dataset for "Optical Investigation of Semi-polar (11-22) AlGaN with High Al Composition"







    
    
    





            
        
                    
            
            

    Electron channelling contrast and cathodoluminescence images obtained from III-nitride layer structures







    
    
    





            
        
                    
            
            

    Dataset for "Colour tuning in white hybrid inorganic/organic light-emitting diodes"







    
    
    





            
        
                    
            
            

    Dataset for "Cool to Warm White Light Emission from Hybrid Inorganic/Organic Light-Emitting Diodes"







    
    
    





            
        
                    
            
            

    Data resulting from an investigation of wide-bandgap silicon-doped AlGaN







    
    
    





            
        
                    
            
            

    Energy filtered electron backscatter diffraction patterns obtained using direct electron imaging