2026
[91]
K. P. Hiller, G. Cios, A. Winkelmann, J. Wheeler, P. J. Parbrook, B. Hourahine, C. Trager-Cowan, J. Bruckbauer
Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction
Acta Mater. 312, 122185 (2026)
Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction
Acta Mater. 312, 122185 (2026)
2025
[90]
D. M. Waters, B. Thompson, G. Ferenczi, B. Hourahine, G. Cios, A. Winkelmann, C. J. M. Stark, C. Wetzel, C. Trager-Cowan, J. Bruckbauer
Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction
J. Appl. Phys. 137, 045701 (2025)
Investigation of (mis-)orientation in zincblende GaN grown on micro-patterned Si(001) using electron backscatter diffraction
J. Appl. Phys. 137, 045701 (2025)
[89]
J. Bruckbauer, G. Cios, A. Sarua, P. Feng, T. Wang, B. Hourahine, A. Winkelmann, C. Trager-Cowan, R. W. Martin
Strain and luminescence properties of hexagonal hillocks in N-polar GaN
J. Appl. Phys. 137, 135705 (2025)
Strain and luminescence properties of hexagonal hillocks in N-polar GaN
J. Appl. Phys. 137, 135705 (2025)
[88]
S. Nicholson, J. Bruckbauer, P. R. Edwards, C. Trager-Cowan, R. W. Martin, A. Ivaturi
Role of the electron transport layer in dictating the nanoscale heterogeneity in all-inorganic perovskite absorbers – correlating the optoelectronic and crystallographic properties
J. Mater. Chem. A 13, 11003 (2025)
Role of the electron transport layer in dictating the nanoscale heterogeneity in all-inorganic perovskite absorbers – correlating the optoelectronic and crystallographic properties
J. Mater. Chem. A 13, 11003 (2025)
[87]
E. Margariti, J. Bruckbauer, A. Winkelmann, B. Guilhabert, N. K. Gunasekar, C. Trager-Cowan, R. Martin, M. Strain
Strain-Induced Modifications of Thin Film Silicon Membranes Through Physical Bending
Materials 18, (2025)
Strain-Induced Modifications of Thin Film Silicon Membranes Through Physical Bending
Materials 18, (2025)
2024
[86]
S. Nicholson, J. Bruckbauer, P. R. Edwards, C. Trager-Cowan, R. W. Martin, A. Ivaturi
Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers
J. Mater. Chem. A 12, 25131 (2024)
Unravelling the chloride dopant induced film improvement in all-inorganic perovskite absorbers
J. Mater. Chem. A 12, 25131 (2024)
2023
[85]
R. Birch, J. Bruckbauer, M. Gajewska, G. Cios, R. Pal, L. E. MacKenzie
Influence of polyvinylpyrrolidone (PVP) in the synthesis of luminescent NaYF4:Yb,Er upconversion nanoparticles
Methods Appl. Fluoresc. 11, 034001 (2023)
Influence of polyvinylpyrrolidone (PVP) in the synthesis of luminescent NaYF4:Yb,Er upconversion nanoparticles
Methods Appl. Fluoresc. 11, 034001 (2023)
[84]
H. Yang, J. Bruckbauer, L. Kanibolotska, A. L. Kanibolotsky, J. Cameron, D. J. Wallis, R. W. Martin, P. J. Skabara
A cross-linkable, organic down-converting material for white light emission from hybrid LEDs
J. Mater. Chem. C 11, 9984 (2023)
A cross-linkable, organic down-converting material for white light emission from hybrid LEDs
J. Mater. Chem. C 11, 9984 (2023)
[83]
P. R. Edwards, J. Bruckbauer, D. Cameron, R. W. Martin
Electroluminescence hyperspectral imaging of light-emitting diodes using a liquid crystal tunable filter
Appl. Phys. Lett. 123, 112110 (2023)
Electroluminescence hyperspectral imaging of light-emitting diodes using a liquid crystal tunable filter
Appl. Phys. Lett. 123, 112110 (2023)
[82]
K. P. Hiller, A. Winkelmann, B. Hourahine, B. Starosta, A. Alasmari, P. Feng, T. Wang, P. J. Parbrook, V. Z. Zubialevich, S. Hagedorn, S. Walde, M. Weyers, P. M. Coulon, P. A. Shields, J. Bruckbauer, C. Trager-Cowan
Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction
Microsc. Microanal. 29, 1879 (2023)
Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction
Microsc. Microanal. 29, 1879 (2023)
2022
[81]
P. Ghosh, J. Bruckbauer, C. Trager-Cowan, L. K. Jagadamma
Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics
Appl. Surf. Sci. 592, 152865 (2022)
Crystalline grain engineered CsPbIBr2 films for indoor photovoltaics
Appl. Surf. Sci. 592, 152865 (2022)
[80]
G. Naresh-Kumar, P. R. Edwards, T. Batten, M. Nouf-Allehiani, A. Vilalta-Clemente, A. J. Wilkinson, E. Le Boulbar, P. A. Shields, B. Starosta, B. Hourahine, R. W. Martin, C. Trager-Cowan
Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy
J. Appl. Phys. 131, (2022)
Non-destructive imaging of residual strains in GaN and their effect on optical and electrical properties using correlative light-electron microscopy
J. Appl. Phys. 131, (2022)
2021
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A. Winkelmann, G. Nolze, G. Cios, T. Tokarski, P. Bala, B. Hourahine, C. Trager-Cowan
Kikuchi pattern simulations of backscattered and transmitted electrons
J. Microsc. 284, 157–184 (2021)
Kikuchi pattern simulations of backscattered and transmitted electrons
J. Microsc. 284, 157–184 (2021)
2020
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J. Bruckbauer, C. Trager-Cowan, B. Hourahine, A. Winkelmann, V. Philippe, A. Ipsen, X. Yu, X. Zhao, M. J. Wallace, P. R. Edwards, G. Naresh-Kumar, M. Hocker, S. Bauer, R. Müller, J. Bai, K. Thonke, T. Wang, R. W. Martin
Luminescence behavior of semipolar (10-11) InGaN/GaN bow-tie structures on patterned Si substrates
J. Appl. Phys. 127, 035705 (2020)
Luminescence behavior of semipolar (10-11) InGaN/GaN bow-tie structures on patterned Si substrates
J. Appl. Phys. 127, 035705 (2020)
[77]
A. A. Wiles, J. Bruckbauer, N. Mohammed, M. Cariello, J. Cameron, N. J. Findlay, E. Taylor-Shaw, D. J. Wallis, R. W. Martin, P. J. Skabara, G. Cooke
A poly(urethane)-encapsulated benzo[2,3-d:6,7-d’]diimidazole organic down-converter for green hybrid LEDs
Mater. Chem. Front. 4, 1006 (2020)
A poly(urethane)-encapsulated benzo[2,3-d:6,7-d’]diimidazole organic down-converter for green hybrid LEDs
Mater. Chem. Front. 4, 1006 (2020)
[76]
C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, G. Ferenczi, B. Hourahine, A. Kotzai, S. Kraeusel, G. Kusch, R. W. Martin, R. McDermott, G. Naresh-Kumar, M. Nouf-Allehiani, E. Pascal, D. Thomson, S. Vespucci, M. D. Smith, P. J. Parbrook, J. Enslin, F. Mehnke, C. Kuhn, T. Wernicke, M. Kneissl, S. Hagedorn, A. Knauer, S. Walde, M. Weyers, P. M. Coulon, P. A. Shields, J. Bai, Y. Gong, L. Jiu, Y. Zhang, R. M. Smith, T. Wang, A. Winkelmann
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Semicond. Sci. Technol. 35, 054001 (2020)
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Semicond. Sci. Technol. 35, 054001 (2020)
[75]
X. Zhao, K. Huang, J. Bruckbauer, S. Shen, C. Zhu, P. Fletcher, P. Feng, Y. Cai, J. Bai, C. Trager-Cowan, R. W. Martin, T. Wang
Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11-22) green LEDs grown on silicon
Sci. Rep. 10, 12650 (2020)
Influence of an InGaN superlattice pre-layer on the performance of semi-polar (11-22) green LEDs grown on silicon
Sci. Rep. 10, 12650 (2020)
[74]
C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, B. M. Jablon, R. Johnston, R. W. Martin, R. Mcdermott, G. Naresh-Kumar, M. Nouf-Allehiani, E. Pascal, D. Thomson, S. Vespucci, K. Mingard, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, A. Knauer, S. Hagedorn, S. Walde, M. Weyers, P. M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
IOP Conf. Ser.: Mater. Sci. 891, 012023 (2020)
Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
IOP Conf. Ser.: Mater. Sci. 891, 012023 (2020)
[73]
J. Bruckbauer, Y. Gong, L. Jiu, M. J. Wallace, A. Ipsen, S. Bauer, R. Müller, J. Bai, K. Thonke, T. Wang, C. Trager-Cowan, R. W. Martin
Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN
J. Phys. D 54, 025107 (2020)
Influence of micro-patterning of the growth template on defect reduction and optical properties of non-polar (11-20) GaN
J. Phys. D 54, 025107 (2020)
[72]
L. Spasevski, G. Kusch, P. Pampili, V. Z. Zubialevich, D. V. Dinh, J. Bruckbauer, P. R. Edwards, P. J. Parbrook, R. W. Martin
A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content
J. Phys. D 54, 035302 (2020)
A systematic comparison of polar and semipolar Si-doped AlGaN alloys with high AlN content
J. Phys. D 54, 035302 (2020)
[71]
F. De Luca, H. Zhang, K. Mingard, M. Stewart, B. M. Jablon, C. Trager-Cowan, M. G. Gee
Nanomechanical behaviour of individual phases in WC-Co cemented carbides, from ambient to high temperature
Materialia 12, (2020)
Nanomechanical behaviour of individual phases in WC-Co cemented carbides, from ambient to high temperature
Materialia 12, (2020)
[70]
G. Naresh-Kumar, A. Alasamari, G. Kusch, P. R. Edwards, R. W. Martin, K. P. Mingard, C. Trager-Cowan
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope
Ultramicroscopy 213, (2020)
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope
Ultramicroscopy 213, (2020)
[69]
B. M. Jablon, K. Mingard, A. Winkelmann, G. Naresh-Kumar, B. Hourahine, C. Trager-Cowan
Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging
Int. J. Refract. Met. Hard Mater. 87, (2020)
Subgrain structure and dislocations in WC-Co hard metals revealed by electron channelling contrast imaging
Int. J. Refract. Met. Hard Mater. 87, (2020)
[68]
A. Winkelmann, B. M. Jablon, V. S. Tong, C. Trager-Cowan, K. P. Mingard
Improving EBSD precision by orientation refinement with full pattern matching
J. Microsc. 277, 79–92 (2020)
Improving EBSD precision by orientation refinement with full pattern matching
J. Microsc. 277, 79–92 (2020)
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S. Walde, S. Hagedorn, P. M. Coulon, A. Mogilatenko, C. Netzel, J. Weinrich, N. Susilo, E. Ziffer, L. Matiwe, C. Hartmann, G. Kusch, A. Alasmari, G. Naresh-Kumar, C. Trager-Cowan, T. Wernicke, T. Straubinger, M. Bickermann, R. W. Martin, P. A. Shields, M. Kneissl, M. Weyers
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy
J. Cryst. Growth 531, (2020)
AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy
J. Cryst. Growth 531, (2020)
2019
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E. Angioni, R. J. Marshall, N. J. Findlay, J. Bruckbauer, B. Breig, D. J. Wallis, R. W. Martin, R. S. Forgan, P. J. Skabara
Implementing fluorescent MOFs as down-converting layers in hybrid light-emitting diodes
J. Mater. Chem. C 7, 2394 (2019)
Implementing fluorescent MOFs as down-converting layers in hybrid light-emitting diodes
J. Mater. Chem. C 7, 2394 (2019)
[65]
Y. Gong, L. Jiu, J. Bruckbauer, J. Bai, R. W. Martin, T. Wang
Monolithic multiple colour emission from InGaN grown on patterned non-polar GaN
Sci. Rep. 9, 986 (2019)
Monolithic multiple colour emission from InGaN grown on patterned non-polar GaN
Sci. Rep. 9, 986 (2019)
[64]
G. Naresh-Kumar, J. Bruckbauer, A. Winkelmann, X. Yu, B. Hourahine, P. R. Edwards, T. Wang, C. Trager-Cowan, R. W. Martin
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope
Nano Lett. 19, 3863 (2019)
Determining GaN Nanowire Polarity and its Influence on Light Emission in the Scanning Electron Microscope
Nano Lett. 19, 3863 (2019)
[63]
C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, R. Johnston, G. Naresh-Kumar, R. W. Martin, M. Nouf-Allehiani, E. Pascal, L. Spasevski, D. Thomson, S. Vespucci, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, S. Hagedorn, A. Knauer, V. Kueller, S. Walde, M. Weyers, P. M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
Photon. Res. 7, B73–B82 (2019)
Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
Photon. Res. 7, B73–B82 (2019)
[62]
E. Pascal, B. Hourahine, C. Trager-Cowan, M. De Graef
Two beam toy model for dislocation contrast in ECCI
Microsc. Microanal. 25, 1968–1969 (2019)
Two beam toy model for dislocation contrast in ECCI
Microsc. Microanal. 25, 1968–1969 (2019)
2018
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C. Brasser, J. Bruckbauer, Y. Gong, L. Jiu, J. Bai, M. Warzecha, P. R. Edwards, T. Wang, R. W. Martin
Cathodoluminescence studies of chevron features in semi-polar (11-22) InGaN/GaN multiple quantum well structures
J. Appl. Phys. 123, 174502 (2018)
Cathodoluminescence studies of chevron features in semi-polar (11-22) InGaN/GaN multiple quantum well structures
J. Appl. Phys. 123, 174502 (2018)
[60]
G. Naresh-Kumar, D. Thomson, Y. Zhang, J. Bai, L. Jiu, X. Yu, Y. P. Gong, R. S. Martin, T. Wang, C. Trager-Cowan
Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging
J. Appl. Phys. 124, (2018)
Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging
J. Appl. Phys. 124, (2018)
[59]
E. Pascal, B. Hourahine, G. Naresh-Kumar, K. Mingard, C. Trager-Cowan
Dislocation contrast in electron channelling contrast images as projections of strain-like components
Mater. Today: Proc. 5, 14652 (2018)
Dislocation contrast in electron channelling contrast images as projections of strain-like components
Mater. Today: Proc. 5, 14652 (2018)
[58]
E. Pascal, S. Singh, P. G. Callahan, B. Hourahine, C. Trager-Cowan, M. De Graef
Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope
Ultramicroscopy 187, 98–106 (2018)
Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope
Ultramicroscopy 187, 98–106 (2018)
[57]
K. P. Mingard, M. Stewart, M. G. Gee, S. Vespucci, C. Trager-Cowan
Practical application of direct electron detectors to EBSD mapping in 2D and 3D
Ultramicroscopy 184, 242–251 (2018)
Practical application of direct electron detectors to EBSD mapping in 2D and 3D
Ultramicroscopy 184, 242–251 (2018)
2017
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J. Bruckbauer, Z. Li, G. Naresh-Kumar, M. Warzecha, P. R. Edwards, L. Jiu, Y. Gong, J. Bai, T. Wang, C. Trager-Cowan, R. W. Martin
Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa(1-x)N with x up to 0.56
Sci. Rep. 7, 10804 (2017)
Spatially-resolved optical and structural properties of semi-polar (11-22) AlxGa(1-x)N with x up to 0.56
Sci. Rep. 7, 10804 (2017)
[55]
Z. Li, L. Wang, L. Jiu, J. Bruckbauer, Y. Gong, Y. Zhang, J. Bai, R. W. Martin, T. Wang
Optical investigation of semi-polar (11-22) AlxGa1-xN with high Al composition
Appl. Phys. Lett. 110, 091102 (2017)
Optical investigation of semi-polar (11-22) AlxGa1-xN with high Al composition
Appl. Phys. Lett. 110, 091102 (2017)
[54]
G. Naresh-Kumar, A. Vilalta-Clemente, H. Jussila, A. Winkelmann, G. Nolze, S. Vespucci, S. Nagarajan, A. J. Wilkinson, C. Trager-Cowan
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Sci. Rep. 7, (2017)
Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Sci. Rep. 7, (2017)
[53]
E. Pascal, S. Singh, B. Hourahine, C. Trager-Cowan, M. De Graef
Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns
Microsc. Microanal. 23, 540–541 (2017)
Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns
Microsc. Microanal. 23, 540–541 (2017)
[52]
E. D. Le Boulbar, J. Priesol, M. Nouf-Allehiani, G. Naresh-Kumar, S. Fox, C. Trager-Cowan, A. Satka, D. W. E. Allsopp, P. A. Shields
Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes
J. Cryst. Growth , 30–38 (2017)
Design and fabrication of enhanced lateral growth for dislocation reduction in GaN using nanodashes
J. Cryst. Growth , 30–38 (2017)
[51]
A. Winkelmann, G. Nolze, S. Vespucci, N. Gunasekar, C. Trager-Cowan, A. Vilalta-Clemente, A. J. Wilkinson, M. Vos
Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
J. Microsc. , (2017)
Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
J. Microsc. , (2017)
[50]
S. Vespucci, G. Naresh-Kumar, C. Trager-Cowan, K. P. Mingard, D. Maneuski, V. O’Shea, A. Winkelmann
Diffractive triangulation of radiative point sources
Appl. Phys. Lett. 110, (2017)
Diffractive triangulation of radiative point sources
Appl. Phys. Lett. 110, (2017)
[49]
S. Vespucci, A. Winkelmann, K. Mingard, D. Maneuski, V. O’Shea, C. Trager-Cowan
Exploring transmission Kikuchi diffraction using a Timepix detector
J. Instrum. 12, (2017)
Exploring transmission Kikuchi diffraction using a Timepix detector
J. Instrum. 12, (2017)
[48]
A. Vilalta-Clemente, G. Naresh-Kumar, M. Nouf-Allehiani, P. Gamarra, M. A. di Forte-Poisson, C. Trager-Cowan, A. J. Wilkinson
Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
Acta Mater. 125, 125–135 (2017)
Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
Acta Mater. 125, 125–135 (2017)
[47]
M. D. Smith, D. Thomson, V. Z. Zubialevich, H. Li, G. Naresh-Kumar, C. Trager-Cowan, P. J. Parbrook
Nanoscale fissure formation in AlxGa(1-x)N/GaN heterostructures and their influence on Ohmic contact formation
Phys. Status Solidi A 214, (2017)
Nanoscale fissure formation in AlxGa(1-x)N/GaN heterostructures and their influence on Ohmic contact formation
Phys. Status Solidi A 214, (2017)
2016
[46]
J. Bruckbauer, C. Brasser, N. J. Findlay, P. R. Edwards, D. J. Wallis, P. J. Skabara, R. W. Martin
Colour tuning in white hybrid inorganic/organic light-emitting diodes
J. Phys. D 49, 405103 (2016)
Colour tuning in white hybrid inorganic/organic light-emitting diodes
J. Phys. D 49, 405103 (2016)
[45]
G. Naresh-Kumar, D. Thomson, M. Nouf-Allehiani, J. Bruckbauer, P. Edwards, B. Hourahine, R. Martin, C. Trager-Cowan
Electron channelling contrast imaging for III-nitride thin film structures
Mater. Sci. Semicond. Process. 47, 44 – 50 (2016)
Electron channelling contrast imaging for III-nitride thin film structures
Mater. Sci. Semicond. Process. 47, 44 – 50 (2016)
[44]
E. Taylor-Shaw, E. Angioni, N. J. Findlay, B. Breig, A. R. Inigo, J. Bruckbauer, D. J. Wallis, P. J. Skabara, R. W. Martin
Cool to warm white light emission from hybrid inorganic/organic light-emitting diodes
J. Mater. Chem. C , (2016)
Cool to warm white light emission from hybrid inorganic/organic light-emitting diodes
J. Mater. Chem. C , (2016)
2015
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K. I. Gries, T. A. Wassner, S. Vogel, J. Bruckbauer, I. Häusler, R. Straubinger, A. Beyer, A. Chernikov, B. Laumer, M. Kracht, C. Heiliger, J. Janek, S. Chatterjee, K. Volz, M. Eickhoff
Self-assembly of ordered wurtzite/rock salt heterostructures-A new view on phase separation in MgxZn1-xO
J. Appl. Phys. 118, 045706 (2015)
Self-assembly of ordered wurtzite/rock salt heterostructures-A new view on phase separation in MgxZn1-xO
J. Appl. Phys. 118, 045706 (2015)
[42]
S. Vespucci, A. Winkelmann, G. Naresh-Kumar, K. P. Mingard, D. Maneuski, P. R. Edwards, A. P. Day, V. O’Shea, C. Trager-Cowan
Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns
Phys. Rev. B 92, (2015)
Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns
Phys. Rev. B 92, (2015)
[41]
G. Kusch, M. Nouf-Allehiani, F. Mehnke, C. Kuhn, P. R. Edwards, T. Wernicke, A. Knauer, V. Kueller, G. Naresh-Kumar, M. Weyers, M. Kneissl, C. Trager-Cowan, R. W. Martin
Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
Appl. Phys. Lett. 107, (2015)
Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
Appl. Phys. Lett. 107, (2015)
2014
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J. Bruckbauer, P. R. Edwards, S. L. Sahonta, F. C. P. Massabuau, M. J. Kappers, C. J. Humphreys, R. A. Oliver, R. W. Martin
Cathodoluminescence hyperspectral imaging of trench-like defects in InGaN/GaN quantum well structures
J. Phys. D 47, 135107 (2014)
Cathodoluminescence hyperspectral imaging of trench-like defects in InGaN/GaN quantum well structures
J. Phys. D 47, 135107 (2014)
[39]
N. J. Findlay, J. Bruckbauer, A. R. Inigo, B. Breig, S. Arumugam, D. J. Wallis, R. W. Martin, P. J. Skabara
An Organic Down-Converting Material for White-Light Emission from Hybrid LEDs
Adv. Mater. 26, 7290 (2014)
An Organic Down-Converting Material for White-Light Emission from Hybrid LEDs
Adv. Mater. 26, 7290 (2014)
[38]
N. J. Findlay, J. Bruckbauer, A. R. Inigo, B. Breig, S. Arumugam, D. J. Wallis, R. W. Martin, P. J. Skabara
Light-Emitting Diodes: An Organic Down-Converting Material for White-Light Emission from Hybrid LEDs (Adv. Mater. 43/2014)
Adv. Mater. 26, 7415–7415 (2014)
Light-Emitting Diodes: An Organic Down-Converting Material for White-Light Emission from Hybrid LEDs (Adv. Mater. 43/2014)
Adv. Mater. 26, 7415–7415 (2014)
[37]
G. Kusch, H. Li, P. R. Edwards, J. Bruckbauer, T. C. Sadler, P. J. Parbrook, R. W. Martin
Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
Appl. Phys. Lett. 104, (2014)
Influence of substrate miscut angle on surface morphology and luminescence properties of AlGaN
Appl. Phys. Lett. 104, (2014)
[36]
G. Naresh-Kumar, J. Bruckbauer, P. R. Edwards, S. Kraeusel, B. Hourahine, R. W. Martin, M. J. Kappers, M. A. Moram, S. Lovelock, R. A. Oliver, C. J. Humphreys, C. Trager-Cowan
Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN
Microsc. Microanal. 20, 55–60 (2014)
Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN
Microsc. Microanal. 20, 55–60 (2014)
[35]
Y. D. Zhuang, J. Bruckbauer, P. A. Shields, P. R. Edwards, R. W. Martin, D. W. E. Allsopp
Influence of stress on optical transitions in GaN nanorods containing a single InGaN/GaN quantum disk
J. Appl. Phys. 116, 174305 (2014)
Influence of stress on optical transitions in GaN nanorods containing a single InGaN/GaN quantum disk
J. Appl. Phys. 116, 174305 (2014)
[34]
G. Naresh-Kumar, A. Vilalta-Clemente, S. Pandey, D. Skuridina, H. Behmenburg, P. Gamarra, G. Patriarche, I. Vickridge, M. A. di Forte-Poisson, P. Vogt, M. Kneissl, M. Morales, P. Ruterana, A. Cavallini, D. Cavalcoli, C. Giesen, M. Heuken, C. Trager-Cowan
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors
AIP Adv. 4, (2014)
Multicharacterization approach for studying InAl(Ga)N/Al(Ga)N/GaN heterostructures for high electron mobility transistors
AIP Adv. 4, (2014)
2013
[33]
J. Bruckbauer, P. R. Edwards, J. Bai, T. Wang, R. W. Martin
Probing light emission from quantum wells within a single nanorod
Nanotechnology 24, 365704 (2013)
Probing light emission from quantum wells within a single nanorod
Nanotechnology 24, 365704 (2013)
[32]
N. J. Findlay, C. Orofino-Pena, J. Bruckbauer, S. E. T. Elmasly, S. Arumugam, A. R. Inigo, A. L. Kanibolotsky, R. W. Martin, A. P. J. Skabara
Linear oligofluorene-BODIPY structures for fluorescence applications
J. Mater. Chem. C 1, 2249 (2013)
Linear oligofluorene-BODIPY structures for fluorescence applications
J. Mater. Chem. C 1, 2249 (2013)
[31]
G. Naresh-Kumar, C. Mauder, K. R. Wang, S. Kraeusel, J. Bruckbauer, P. R. Edwards, B. Hourahine, H. Kalisch, A. Vescan, C. Giesen, M. Heuken, A. Trampert, A. P. Day, C. Trager-Cowan
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope
Appl. Phys. Lett. 102, 142103 (2013)
Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope
Appl. Phys. Lett. 102, 142103 (2013)
[30]
Y. D. Zhuang, S. Lis, J. Bruckbauer, S. E. J. O’Kane, P. A. Shields, P. R. Edwards, J. Sarma, R. W. Martin, D. W. E. Allsopp
Optical Properties of GaN Nanorods Containing a Single or Multiple InGaN Quantum Wells
Jpn. J. Appl. Phys. 52, 08JE11 (2013)
Optical Properties of GaN Nanorods Containing a Single or Multiple InGaN Quantum Wells
Jpn. J. Appl. Phys. 52, 08JE11 (2013)
[29]
S. Nagarajan, O. Svensk, M. Ali, G. Naresh-Kumar, C. Trager-Cowan, S. Suihkonen, M. Sopanen, H. Lipsanen
Stress distribution of GaN layer grown on micro-pillar patterned GaN templates
Appl. Phys. Lett. 103, (2013)
Stress distribution of GaN layer grown on micro-pillar patterned GaN templates
Appl. Phys. Lett. 103, (2013)
2012
[28]
P. R. Edwards, L. K. Jagadamma, J. Bruckbauer, C. Liu, P. Shields, D. Allsopp, T. Wang, R. W. Martin
High-Resolution Cathodoluminescence Hyperspectral Imaging of Nitride Nanostructures
Microsc. Microanal. 18, 1212 (2012)
High-Resolution Cathodoluminescence Hyperspectral Imaging of Nitride Nanostructures
Microsc. Microanal. 18, 1212 (2012)
[27]
N. Gunasekar, B. Hourahine, P. Edwards, A. P. Day, A. Winkelmann, A. J. Wilkinson, P. J. Parbrook, G. England, C. Trager-Cowan
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope
Phys. Rev. Lett. 108, (2012)
Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope
Phys. Rev. Lett. 108, (2012)
[26]
G. Naresh-Kumar, B. Hourahine, A. Vilalta-Clemente, P. Ruterana, P. Gamarra, C. Lacam, M. Tordjman, M. A. D. Forte-Poisson, P. J. Parbrook, A. P. Day, G. England, C. Trager-Cowan
Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope
Phys. Status Solidi A 209, 424–426 (2012)
Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope
Phys. Status Solidi A 209, 424–426 (2012)
2011
[25]
J. Bruckbauer, P. R. Edwards, T. Wang, R. W. Martin
High resolution cathodoluminescence hyperspectral imaging of surface features in InGaN/GaN multiple quantum well structures
Appl. Phys. Lett. 98, 141908 (2011)
High resolution cathodoluminescence hyperspectral imaging of surface features in InGaN/GaN multiple quantum well structures
Appl. Phys. Lett. 98, 141908 (2011)
2010
[24]
C. Trager-Cowan
Cafe scientifique: nobel laureate communicates science across the world
MRS Bulletin 35, 10–11 (2010)
Cafe scientifique: nobel laureate communicates science across the world
MRS Bulletin 35, 10–11 (2010)
2009
[23]
I. S. Roqan, K. P. O’Donnell, R. W. Martin, C. Trager-Cowan, V. Matias, A. Vantomme, K. Lorenz, E. Alves, I. M. Watson
Optical and structural properties of Eu-implanted InxAl(1-x)N
J. Appl. Phys. 106, (2009)
Optical and structural properties of Eu-implanted InxAl(1-x)N
J. Appl. Phys. 106, (2009)
[22]
K. Lorenz, I. S. Roqan, N. Franco, K. P. O’Donnell, V. Darakchieva, E. Alves, C. Trager-Cowan, R. W. Martin, D. J. As, M. Panfilova
Europium doping of zincblende GaN by ion implantation
J. Appl. Phys. 105, (2009)
Europium doping of zincblende GaN by ion implantation
J. Appl. Phys. 105, (2009)
2008
[21]
C. Trager-Cowan
The Rank prize funds: nurturing advancement in optoelectronics
MRS Bulletin 33, 999–1000 (2008)
The Rank prize funds: nurturing advancement in optoelectronics
MRS Bulletin 33, 999–1000 (2008)
[20]
I. S. Roqan, E. Nogales, K. P. O’Donnell, C. Trager-Cowan, R. W. Martin, G. Halambalakis, O. Briot
The effect of growth temperature on the luminescence and structural properties of gan : tm films grown by gas-source mbe
J. Cryst. Growth 310, 4069–4072 (2008)
The effect of growth temperature on the luminescence and structural properties of gan : tm films grown by gas-source mbe
J. Cryst. Growth 310, 4069–4072 (2008)
[19]
K. Lorenz, E. Alves, I. S. Roqan, R. W. Martin, C. Trager-Cowan, K. P. O’Donnell, I. M. Watson
Rare earth doping of III-nitride alloys by ion implantation
Phys. Status Solidi A 205, 34–37 (2008)
Rare earth doping of III-nitride alloys by ion implantation
Phys. Status Solidi A 205, 34–37 (2008)
[18]
I. S. Roqan, K. P. O’Donnell, C. Trager-Cowan, B. Hourahine, R. W. Martin, K. Lorenz, E. Alves, D. J. As, M. Panfilova, I. M. Watson
Luminescence spectroscopy of Eu-implanted zincblende GaN
Phys. Status Solidi B 245, 170–173 (2008)
Luminescence spectroscopy of Eu-implanted zincblende GaN
Phys. Status Solidi B 245, 170–173 (2008)
2007
[17]
C. Trager-Cowan
Light makes an impact on the lives and healthcare of Scots
MRS Bulletin 32, 673–674 (2007)
Light makes an impact on the lives and healthcare of Scots
MRS Bulletin 32, 673–674 (2007)
[16]
C. Trager-Cowan, F. Sweeney, P. W. Trimby, A. P. Day, A. Gholinia, N.-.-H. Schmidt, P. J. Parbrook, A. J. Wilkinson, I. M. Watson
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
Phys. Rev. B 75, (2007)
Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
Phys. Rev. B 75, (2007)
[15]
A. Winkelmann, C. Trager-Cowan, F. Sweeney, A. P. Day, P. Parbrook
Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns
Ultramicroscopy 107, 414–421 (2007)
Many-Beam Dynamical Simulation of Electron Backscatter Diffraction Patterns
Ultramicroscopy 107, 414–421 (2007)
2006
[14]
I. S. Roqan, K. Lorenz, K. P. O’Donnell, C. Trager-Cowan, R. W. Martin, I. M. Watson, E. Alves
Blue cathodoluminescence from thulium implanted AlxGa(1-x)N and InxAl(1-x)N
Superlattices Microstruct. 40, 445–451 (2006)
Blue cathodoluminescence from thulium implanted AlxGa(1-x)N and InxAl(1-x)N
Superlattices Microstruct. 40, 445–451 (2006)
[13]
C. Trager-Cowan, F. Sweeney, A. Winkelmann, A. J. Wilkinson, P. W. Trimby, A. P. Day, A. Gholinia, N. H. Schmidt, P. J. Parbrook, I. M. Watson
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
Mater. Sci. Technol. 22, 1352–1358(7) (2006)
Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
Mater. Sci. Technol. 22, 1352–1358(7) (2006)
[12]
I. Roqan, C. Trager-Cowan, B. Hourahine, K. Lorenz, E. Nogales, K. P. O’Donnell, R. W. Martin, E. Alves, S. Ruffenach, O. Briot
Characterization of the blue emission of Tm/Er co-implanted GaN
MRS Online Proceedings Library , 599–604 (2006)
Characterization of the blue emission of Tm/Er co-implanted GaN
MRS Online Proceedings Library , 599–604 (2006)
2005
[11]
[10]
M. R. Lee, R. W. Martin, C. Trager-Cowan, P. R. Edwards
Imaging of cathodoluminescence zoning in calcite by scanning electron microscopy and hyperspectral mapping
J. Sediment. Res. 75, 313–322 (2005)
Imaging of cathodoluminescence zoning in calcite by scanning electron microscopy and hyperspectral mapping
J. Sediment. Res. 75, 313–322 (2005)
2002
[9]
C. Trager-Cowan, F. Sweeney, A. J. Wilkinson, I. M. Watson, P. G. Middleton, K. P. O’Donnell, D. Zubia, S. D. Hersee, S. Einfeldt, D. Hommel
Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
Phys. Status Solidi C 0, 532–536 (2002)
Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
Phys. Status Solidi C 0, 532–536 (2002)
[8]
S. M. D. S. Pereira, M. R. Correia, E. Pereira, C. Trager-Cowan, F. Sweeney, K. O’Donnell, E. Alves, N. Franco, A. D. Sequeira
Structural and optical properties of InGaN/GaN layers close to the critical layer thickness
Appl. Phys. Lett. 81, 1207 (2002)
Structural and optical properties of InGaN/GaN layers close to the critical layer thickness
Appl. Phys. Lett. 81, 1207 (2002)
[7]
C. Trager-Cowan, F. Sweeney, J. Hastie, S. K. Manson-Smith, D. A. Cowan, D. McColl, A. Mohammed, K. P. O’Donnell, D. Zubia, S. D. Hersee, C. T. Foxon, I. Harrison, S. V. Novikov
Characterisation of nitride thin films by EBSD
J. Microsc. 205, 226–230 (2002)
Characterisation of nitride thin films by EBSD
J. Microsc. 205, 226–230 (2002)
2001
[6]
S. K. Manson-Smith, C. Trager-Cowan, K. P. O’Donnell
Scanning tunnelling luminescence studies of nitride semiconductor thin films under ambient conditions
Phys. Status Solidi B 228, 445 –448 (2001)
Scanning tunnelling luminescence studies of nitride semiconductor thin films under ambient conditions
Phys. Status Solidi B 228, 445 –448 (2001)
[5]
S. M. D. S. Pereira, M. R. Correia, E. M. Ferreira Pereira Lopes, K. P. O’Donnell, C. Trager-Cowan, F. Sweeney, E. Alves, A. D. Sequeira, N. Franco, I. M. Watson
Depth resolved studies of indium content and strain in InGaN layers
Phys. Status Solidi B 228, 59–64 (2001)
Depth resolved studies of indium content and strain in InGaN layers
Phys. Status Solidi B 228, 59–64 (2001)
[4]
I. M. Watson, C. Liu, K. S. Kim, H. S. Kim, C. J. Deatcher, J. M. Girkin, M. D. Dawson, P. R. Edwards, C. Trager-Cowan, R. W. Martin
In situ and ex situ evaluation of mechanisms of lateral epitaxial overgrowth
Phys. Status Solidi A 188, 743–746 (2001)
In situ and ex situ evaluation of mechanisms of lateral epitaxial overgrowth
Phys. Status Solidi A 188, 743–746 (2001)
[3]
K. P. O’Donnell, R. W. Martin, C. Trager-Cowan, M. E. White
The dependence of the optical energies on InGaN composition
Mater. Sci. Eng. B 82, 194–196 (2001)
The dependence of the optical energies on InGaN composition
Mater. Sci. Eng. B 82, 194–196 (2001)
[2]
R. W. Martin, P. R. Edwards, R. Pecharroman-Gallego, C. Trager-Cowan, T. Kim, H. S. Kim, K. S. Kim, I. M. Watson, M. D. Dawson
Buried dielectric mirrors for the lateral overgrowth of GaN-based microcavities
Phys. Status Solidi A 183, 145–149 (2001)
Buried dielectric mirrors for the lateral overgrowth of GaN-based microcavities
Phys. Status Solidi A 183, 145–149 (2001)
[1]
P. I. Kuznetsov, B. S. Shchamkhalova, V. A. Jitov, G. G. Yakushcheva, V. I. Kozlovsky, K. P. O’Donnell, C. Trager-Cowan, P. R. Edwards
MOCVD growth and characterisation of ZnS/ZnSe distributed Bragg reflectors and ZnCdSe/ZnSe heterostructures for green VCSEL
Physics of Low-Dimensional Structures 11, 271–278 (2001)
MOCVD growth and characterisation of ZnS/ZnSe distributed Bragg reflectors and ZnCdSe/ZnSe heterostructures for green VCSEL
Physics of Low-Dimensional Structures 11, 271–278 (2001)