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Advanced Materials Diffraction Lab

Advanced Materials Diffraction Lab

  • People
  • Publications
    • Papers
    • Book chapters
  • Techniques
    • Electron backscatter diffraction
    • Transmission Kikuchi diffraction
    • Direct electron detection
    • Electron channelling contrast imaging
    • Cathodoluminescence hyperspectral imaging
    • Other correlative SEM techniques
  • Research
    • Research grants
  • Contact

Book chapters

Chapter 8: Microscopy of defects in semiconductors
F. C.-P Massabuau, J. Bruckbauer, C. Trager-Cowan, and R. A. Oliver


in Characterisation and Control of Defects in Semiconductors (Editor: F. Tuomisto; IET, London, 2020)

Chapter 10: Organic–Inorganic Semiconductor Heterojunctions for Hybrid Light-Emitting Diodes
J. Bruckbauer, and N. J. Findlay


in Optoelectronic Organic-Inorganic Semiconductor Heterojunctions (Editor: Y. Zhou; CRC Press, 2021)

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